seesaw: device support and tests

seesaw/seesaw_test.go

@@ -0,0 +1,84 @@
+package seesaw
+
+import (
+	"reflect"
+	"testing"
+	"time"
+)
+
+func TestDevice_SoftReset_success(t *testing.T) {
+
+	mocked := newMockDev(t, 0x49,
+		when([]byte{0x00, 0x7F, 0xFF}, nil, nil),
+		when([]byte{0x00, 0x01}, nil, nil),
+		when(nil, []byte{0x55}, nil),
+	)
+
+	sut := New(mocked)
+
+	err := sut.SoftReset()
+	assertEquals(t, err, nil)
+}
+
+func TestDevice_WriteRegister(t *testing.T) {
+
+	write := byte(0x1F)
+	mocked := newMockDev(t, 0x49,
+		when([]byte{0x01, 0x04, write}, nil, nil),
+	)
+
+	sut := New(mocked)
+
+	err := sut.WriteRegister(ModuleGpioBase, FunctionGpioBulk, write)
+	assertEquals(t, err, nil)
+}
+
+func TestDevice_ReadRegister(t *testing.T) {
+
+	read := byte(0x23)
+	mocked := newMockDev(t, 0x49,
+		when([]byte{0x0F, 0x10}, nil, nil),
+		when(nil, []byte{read}, nil),
+	)
+
+	sut := New(mocked)
+
+	r, err := sut.ReadRegister(ModuleTouchBase, FunctionTouchChannelOffset)
+	assertEquals(t, err, nil)
+	assertEquals(t, r, read)
+}
+
+func TestDevice_Read(t *testing.T) {
+
+	expectedRead := []byte{0x01, 0x02, 0x03, 0x04, 0x05}
+	mocked := newMockDev(t, 0x49,
+		when([]byte{0x0F, 0x10}, nil, nil),
+		when(nil, expectedRead, nil),
+	)
+
+	sut := New(mocked)
+
+	var buf [5]byte
+	err := sut.Read(ModuleTouchBase, FunctionTouchChannelOffset, buf[:], time.Nanosecond)
+	assertEquals(t, err, nil)
+	assertEquals(t, buf[:], expectedRead)
+}
+
+func TestDevice_Write(t *testing.T) {
+
+	expectedWrite := []byte{0x01, 0x02, 0x03, 0x04, 0x05}
+	mocked := newMockDev(t, 0x49,
+		when(append([]byte{0x0E, 0x04}, expectedWrite...), nil, nil),
+	)
+
+	sut := New(mocked)
+
+	err := sut.Write(ModuleNeoPixelBase, FunctionNeopixelBuf, expectedWrite)
+	assertEquals(t, err, nil)
+}
+
+func assertEquals[e any](t *testing.T, actual, expected e) {
+	if !reflect.DeepEqual(actual, expected) {
+		t.Fatalf("actual %+v != %+v not equals expected", actual, expected)
+	}
+}